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Plenary Lecturers:
Professor Sir Harry Kroto FRS, Nobel Laureate,
University of Sussex, UK:
Some New Insights in to the Mechanisms of Fullerene
and Nanotube Formation
Professor Simon Gaskell, The University of Manchester,
UK:
The contribution of mass spectrometry to the
bio-sciences
Core Conference Themes:
Frontiers in the analysis of semiconductor materials
Wilfried Vandervorst, IMEC, Belgium:
Nanoscale semiconductor technologies
- the challenge for SIMS
Paul Ronsheim, IBM, USA:
Depth
profiling for emerging semiconductor materials
Joe Bennett, International SEMATECH, USA:
Raporteur for Session on advanced dielectric materials
Yuji Kataoka, Fujitsu Laboratories Ltd, Japan:
Ultrashallow depth profiling by using SIMS and
Ion Scattering Spectroscopy
New developments of SIMS in nano- and bio-technology
Klaus Wittmaack, GSF, Germany:
SIMS
of Nanoparticles
Patrick Bertrand, Université Catholique
de Louvain, Belgium:
A
review of SSIMS for analysis of molecular conformation and orientation
Advances in the analysis of organics
Arnaud Delcorte, Université Catholique
de Lovain, Belgium:
Matrix
Enhanced SIMS
Michael Karas, Johann Wolfgang Goethe University
of Frankfurt:
Why MALDI works – From Hypotheses to Experimental
Evidence
Lu-Tao Weng, The Hong Kong University of Science
and Technology:
SSIMS
analysis of organics, polymer blends and interfaces
Andreas Wucher, University of Essen, Germany:
A fundamental review of organic ion emission
using cluster ion beams
Advances in data interpretation
Matt Wagner, Proctor and Gamble Inc., USA:
The
application of multivariate analysis techniques to SIMS data
Satoka Aoyagi, Shimane University, Japan:
Mutual
Information Theory for Biomedical Applications
SIMS using polyatomic primary beams
Session organized by Nicholas Winograd, Penn State University, USA
Advances in theoretical modelling
Barbara Garrison, Penn State University, USA:
Atoms,
Clusters and Photons: Energetic Probes for Mass Spectrometry
